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Subsurface incorporation of Co atoms into Si(100)

  • Junghun Choi
  • , Youngwoo Kim
  • , Do Kyung Lim
  • , Do Hwan Kim*
  • , Sehun Kim
  • *Corresponding author for this work
  • Korea Advanced Institute of Science and Technology
  • Daegu University

Research output: Contribution to journalJournal articlepeer-review

Abstract

The initial adsorption structures of Co on Si(100) were investigated using scanning tunneling microscopy (STM). Filled-state STM images showed bright protrusions at Si dimers. Density functional theory calculations demonstrated that Co atoms at subsurface interstitial sites beneath Si dimers are the most stable. Simulated STM images confirmed that the bright features observed at Si dimers were due to Co atoms incorporated at subsurface interstitial sites.

Original languageEnglish
Pages (from-to)15467-15470
Number of pages4
JournalJournal of Physical Chemistry C
Volume115
Issue number31
DOIs
StatePublished - 2011.08.11

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