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Surface Evolution of Polymer Films Grown by Vapor Deposition: Growth of Local and Global Slopes of Interfaces

  • Jungyu Shin
  • , I. J. Lee*
  • *Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

Abstract

The kinetic roughening of polymer films grown by vapor deposition polymerization was analyzed using the widely accepted classification framework of “generic scaling ansatz” given for the structure factor. Over the past two decades, this method has played a pivotal role in classifying diverse forms of dynamic scaling and understanding the mechanisms driving interface roughening. The roughness exponents of the polymer films were consistently determined as (Formula presented.), and (Formula presented.). However, the inability to unambiguously assign these roughness exponent values to a specific scaling subclass prompts the proposal of a practical alternative. This report illustrates how all potential dynamic scaling can be consistently identified and classified based on the relationship between two temporal scaling exponents measured in real space: the average local slope and the global slope of the interface. The intrinsic anomalous roughening class is conclusively assigned to polymer film growth characterized by anomalous “native (background slope-removed) local height fluctuations”. Moreover, the new analysis reveals that interfaces exhibiting anomalous scaling, previously classified as intrinsic anomalous roughening, could potentially belong to the super-rough class, particularly when the spectral roughness exponent (Formula presented.) is equal to 1.

Original languageEnglish
Article number1535
JournalPolymers
Volume16
Issue number11
DOIs
StatePublished - 2024.06

Keywords

  • atomic force microscopy
  • kinetic roughening
  • polymer film growth
  • surface roughness
  • vapor deposition polymerization

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Chemistry

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