Synthesis and microstructural properties of ZnO nanorods on Ti-buffer layers

C. H. Kwak; B. H. Kim; C. I. Park; S. Y. Seo; S. H. Kim; S. W. Han

doi:10.1016/j.jcrysgro.2010.10.066

Synthesis and microstructural properties of ZnO nanorods on Ti-buffer layers

C. H. Kwak
, B. H. Kim
, C. I. Park
, S. Y. Seo
, S. H. Kim
, S. W. Han^*

^*Corresponding author for this work

Physics Education

Pohang University of Science and Technology
Jeonbuk National University

Research output: Contribution to journal › Journal article › peer-review

10 Scopus citations

Abstract

This study examined the structural properties of ZnO nanorods grown on Ti-buffer layers with different surface roughnesses of 1.5 and 4.0 nm. Vertically aligned ZnO nanorods were synthesized on Al₂O₃ substrates with a Ti-buffer layer by metal-organic chemical vapor deposition. X-ray diffraction revealed the ZnO nanorods grown on a smooth surface to have higher quality and better alignment in the ab-plane than those grown on the rough surface. Field-emission transmission electron microscopy (FE-TEM) measurements revealed a disordered layer at the ZnO/Ti interface. FE-TEM demonstrated that the Ti-buffer layer contained a mixture of ordered and amorphous phases. Energy dispersive spectroscopy (EDS) analysis revealed the Ti-buffer layers to be entirely oxides.

Original language	English
Pages (from-to)	264-267
Number of pages	4
Journal	Journal of Crystal Growth
Volume	314
Issue number	1
DOIs	https://doi.org/10.1016/j.jcrysgro.2010.10.066
State	Published - 2011.01.1

Keywords

A1. Interfaces
A3. Metal-organic chemical vapor deposition
B1. Zinc compounds
B2. Semiconducting IIVI materials

Quacquarelli Symonds(QS) Subject Topics

Materials Science
Chemistry
Physics & Astronomy

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10.1016/j.jcrysgro.2010.10.066

Cite this

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title = "Synthesis and microstructural properties of ZnO nanorods on Ti-buffer layers",

abstract = "This study examined the structural properties of ZnO nanorods grown on Ti-buffer layers with different surface roughnesses of 1.5 and 4.0 nm. Vertically aligned ZnO nanorods were synthesized on Al2O3 substrates with a Ti-buffer layer by metal-organic chemical vapor deposition. X-ray diffraction revealed the ZnO nanorods grown on a smooth surface to have higher quality and better alignment in the ab-plane than those grown on the rough surface. Field-emission transmission electron microscopy (FE-TEM) measurements revealed a disordered layer at the ZnO/Ti interface. FE-TEM demonstrated that the Ti-buffer layer contained a mixture of ordered and amorphous phases. Energy dispersive spectroscopy (EDS) analysis revealed the Ti-buffer layers to be entirely oxides.",

keywords = "A1. Interfaces, A3. Metal-organic chemical vapor deposition, B1. Zinc compounds, B2. Semiconducting IIVI materials",

author = "Kwak, \{C. H.\} and Kim, \{B. H.\} and Park, \{C. I.\} and Seo, \{S. Y.\} and Kim, \{S. H.\} and Han, \{S. W.\}",

year = "2011",

month = jan,

day = "1",

doi = "10.1016/j.jcrysgro.2010.10.066",

language = "English",

volume = "314",

pages = "264--267",

journal = "Journal of Crystal Growth",

issn = "0022-0248",

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TY - JOUR

T1 - Synthesis and microstructural properties of ZnO nanorods on Ti-buffer layers

AU - Kwak, C. H.

AU - Kim, B. H.

AU - Park, C. I.

AU - Seo, S. Y.

AU - Kim, S. H.

AU - Han, S. W.

PY - 2011/1/1

Y1 - 2011/1/1

N2 - This study examined the structural properties of ZnO nanorods grown on Ti-buffer layers with different surface roughnesses of 1.5 and 4.0 nm. Vertically aligned ZnO nanorods were synthesized on Al2O3 substrates with a Ti-buffer layer by metal-organic chemical vapor deposition. X-ray diffraction revealed the ZnO nanorods grown on a smooth surface to have higher quality and better alignment in the ab-plane than those grown on the rough surface. Field-emission transmission electron microscopy (FE-TEM) measurements revealed a disordered layer at the ZnO/Ti interface. FE-TEM demonstrated that the Ti-buffer layer contained a mixture of ordered and amorphous phases. Energy dispersive spectroscopy (EDS) analysis revealed the Ti-buffer layers to be entirely oxides.

AB - This study examined the structural properties of ZnO nanorods grown on Ti-buffer layers with different surface roughnesses of 1.5 and 4.0 nm. Vertically aligned ZnO nanorods were synthesized on Al2O3 substrates with a Ti-buffer layer by metal-organic chemical vapor deposition. X-ray diffraction revealed the ZnO nanorods grown on a smooth surface to have higher quality and better alignment in the ab-plane than those grown on the rough surface. Field-emission transmission electron microscopy (FE-TEM) measurements revealed a disordered layer at the ZnO/Ti interface. FE-TEM demonstrated that the Ti-buffer layer contained a mixture of ordered and amorphous phases. Energy dispersive spectroscopy (EDS) analysis revealed the Ti-buffer layers to be entirely oxides.

KW - A1. Interfaces

KW - A3. Metal-organic chemical vapor deposition

KW - B1. Zinc compounds

KW - B2. Semiconducting IIVI materials

UR - https://www.scopus.com/pages/publications/78651107339

U2 - 10.1016/j.jcrysgro.2010.10.066

DO - 10.1016/j.jcrysgro.2010.10.066

M3 - Journal article

AN - SCOPUS:78651107339

SN - 0022-0248

VL - 314

SP - 264

EP - 267

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

IS - 1

ER -

Synthesis and microstructural properties of ZnO nanorods on Ti-buffer layers

Abstract

Keywords

Quacquarelli Symonds(QS) Subject Topics

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