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Temperature dependence of photocurrent in an amorphous GaInZnO/InZnO thin film transistor

  • Ji Hoon Ahn*
  • , Seung Eon Ahn
  • , Yongwoo Jeon
  • , Seunghyup Lee
  • , Ihun Song
  • , Jungwoo Kim
  • , Hyung Choi
  • , U. In Chung
  • *Corresponding author for this work
  • Samsung

Research output: Contribution to journalJournal articlepeer-review

Abstract

The temperature dependence of the photocurrent of amorphous GaInZnO/InZnO thin film transistors was investigated at various illumination wavelengths. The photocurrent is highly dependent on the irradiation conditions, even though the saturation characteristics were similar regardless of illumination. When the photon energy was greater than 2.82 eV, it was large enough to excite a bound electron independent of the thermal energy. When the irradiation photon energy was not large enough for direct excitation, it was observed that the states in the Urbach tail region, approximately 0.18-0.28 eV below the conduction band, acted as shallow traps that induced a thermally activated photocurrent.

Original languageEnglish
Article number173515
JournalApplied Physics Letters
Volume103
Issue number17
DOIs
StatePublished - 2013.10.21

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