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Temperature dependent efficiency droop in GaInN light-emitting diodes with different current densities

  • David S. Meyaard*
  • , Qifeng Shan
  • , Jaehee Cho
  • , E. Fred Schubert
  • , Sang Heon Han
  • , Min Ho Kim
  • , Cheolsoo Sone
  • , Seung Jae Oh
  • , Jong Kyu Kim
  • *Corresponding author for this work
  • Rensselaer Polytechnic Institute
  • Samsung
  • Pohang University of Science and Technology

Research output: Contribution to journalJournal articlepeer-review

Abstract

The effect of chip area on the temperature-dependent light-output power (LOP) in GaInN-based light-emitting diodes (LEDs) is investigated. The larger the chip size, the faster the reduction in LOP with increasing temperature becomes, indicating that increasing the size of LED chips, a technology trend for reducing the efficiency droop at high currents, is detrimental for high temperature-tolerant LEDs. In addition, it is found that regardless of chip size, the temperature-dependent LOP is identical for the LEDs operating at the same current density.

Original languageEnglish
Article number081106
JournalApplied Physics Letters
Volume100
Issue number8
DOIs
StatePublished - 2012.02.20

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