Temperature-dependent electronic charge transport characteristics at MoS₂/p-type Ge heterojunctions

Significant effort has been devoted to constructing two-dimensional transition metal dichalcogenides-based hybrid heterojunctions with enhanced performance or unique functionalities for versatile device applications in emerging electronics and optoelectronics. In this study, we report the temperature-dependent electronic charge transport characteristics in MoS₂/p-type Ge heterojunction diodes. From the current-voltage (I-V) characteristics of the heterojunction device, it is observed that different transport phenomena can occur depending upon the temperature and bias voltage. The charge transport is dominated by thermionic emission in the high-temperature regime above 300 K, whereas in low-temperature regime below 300 K, the charge transport mechanism transitions from the thermionic emission to the tunneling mechanism associated with trap sites. In particular, the I-V characteristics in the low-temperature regime show a transition from the direct tunneling at a low bias to the Fowler-Nordheim tunneling mechanism at a high bias. This could be well described by the electrical analyses on temperature-dependent I-V behavior and corresponding energy band diagrams.