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Terahertz generation (0.3-0.8THz) achieved by photomixer based on low-temperature grown InGaAs emitter

  • J. O. Kim*
  • , S. J. Lee
  • , D. S. Yee
  • , S. K. Noh
  • , J. H. Shin
  • , K. H. Park
  • , D. W. Park
  • , Jin S. Kim
  • , Jong S. Kim
  • *Corresponding author for this work
  • Korea Research Institute of Standards and Science
  • Electronics and Telecommunications Research Institute
  • Jeonbuk National University
  • Yeungnam University

Research output: Contribution to conferenceConference paperpeer-review

Abstract

Continuous-wave (CW) terahertz (THz) generation has been successfully achieved by low-temperature grown (LTG) In 1-xGa xAs (x=0.47) epitaxial layer as a THz emitter and a photomixer module with dual-wavelength laser as an optical beat source. The reflectance decay spectroscopy revealed a carrier lifetime of ∼ 2.5 ps in LTG-InGaAs layer grown at 220°C and subsequently in-situ annealed at 550°C for 10 min. The THz ouput characteristics are demonstrated in the range of 0.3-0.8 THz.

Original languageEnglish
Title of host publicationPhysics of Semiconductors - 30th International Conference on the Physics of Semiconductors, ICPS-30
Pages921-922
Number of pages2
DOIs
StatePublished - 2011
Event30th International Conference on the Physics of Semiconductors, ICPS-30 - Seoul, Korea, Republic of
Duration: 2010.07.252010.07.30

Publication series

NameAIP Conference Proceedings
Volume1399
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference30th International Conference on the Physics of Semiconductors, ICPS-30
Country/TerritoryKorea, Republic of
CitySeoul
Period10.07.2510.07.30

Keywords

  • Carrier lifetime
  • Low-temperature-grown InGaAs
  • Photomixer
  • Terahertz

Quacquarelli Symonds(QS) Subject Topics

  • Physics & Astronomy

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