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The AES and micro-raman characteristics of diamond thin films grown by EACVD as the nucleation free energy increases

  • C. R. Lee*
  • , J. Y. Leem
  • , B. S. Chun
  • *Corresponding author for this work
  • Korea Research Institute of Standards and Science
  • Chungnam National University

Research output: Contribution to journalJournal articlepeer-review

Original languageEnglish
Pages (from-to)361-365
Number of pages5
JournalJournal of Materials Science Letters
Volume14
Issue number5
DOIs
StatePublished - 1995.05

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