Abstract
The electric transport properties of an Al/Al2O3/Ni/Al2O3/Al single-electron transistor were studied. Compared to the all-normal-metal single-electron transistors, our sample showed enhanced tunnel current inside the Coulomb gap both in the superconducting and the normal state of the Al. The tunnel current showed sharp increase for the magnetic field H ≈ ± 1.57 T, which also was evidenced by the change of current-voltage (I-V) characteristics with the magnetic field.
| Original language | English |
|---|---|
| Pages (from-to) | 1794-1795 |
| Number of pages | 2 |
| Journal | Physica B: Physics of Condensed Matter |
| Volume | 284-288 |
| Issue number | PART II |
| DOIs | |
| State | Published - 2000 |
Keywords
- Coulomb blockade
- Ferromagnetic tunnel junction
- Single electron transistor
- Single electron tunneling
Quacquarelli Symonds(QS) Subject Topics
- Materials Science
- Engineering - Electrical & Electronic
- Engineering - Petroleum
- Physics & Astronomy
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