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Theoretical Study of Scanning Probe Microscope Images of VTe2

  • Soo Park Sung*
  • , Jeeyoung Lee
  • , Ro Lee Wang
  • , Hag Lee Kee
  • *Corresponding author for this work
  • Samsung
  • Wonkwang University
  • Iksan National College

Research output: Contribution to journalJournal articlepeer-review

Abstract

Ab initio periodic Hartree-Fock calculations with the full potential and minimum basis set are applied to interpretation of scanning tunneling microscope (STM) and atomic force microscope (AFM) images on 1T-VTe2. Our results show that the simulated STM image shows asymmetry while the simulated AFM image shows the circular electron densities at the bright spots without asymmetry of electron density to agree with the experimental AFM image. The bright spots of both the STM and AFM images of VTe2 are associated with the surface Te atoms, while the patterns of bright spots of STM and AFM images are different.

Original languageEnglish
Pages (from-to)81-84
Number of pages4
JournalBulletin of the Korean Chemical Society
Volume28
Issue number1
DOIs
StatePublished - 2007.01

Keywords

  • Ab initio method
  • Atomic force microscope image
  • IT-VTe2
  • Scanning tunneling microscope image
  • Simulated STM and AFM images

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