Abstract
Ab initio periodic Hartree-Fock calculations with the full potential and minimum basis set are applied to interpretation of scanning tunneling microscope (STM) and atomic force microscope (AFM) images on 1T-VTe2. Our results show that the simulated STM image shows asymmetry while the simulated AFM image shows the circular electron densities at the bright spots without asymmetry of electron density to agree with the experimental AFM image. The bright spots of both the STM and AFM images of VTe2 are associated with the surface Te atoms, while the patterns of bright spots of STM and AFM images are different.
| Original language | English |
|---|---|
| Pages (from-to) | 81-84 |
| Number of pages | 4 |
| Journal | Bulletin of the Korean Chemical Society |
| Volume | 28 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2007.01 |
Keywords
- Ab initio method
- Atomic force microscope image
- IT-VTe2
- Scanning tunneling microscope image
- Simulated STM and AFM images
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