@inproceedings{e24a1d99c4814ac4bee34975c7653e53,
title = "Thermal Conductivity of Rough Silicon Nanowires with Silicide Layer",
abstract = "Rough silicon nanowires have considered as promising building block for high efficiency thermoelectric device. We demonstrate that the thermal conductivity of rough nanowires is further reduced by forming cobalt silicide layer on their both ends. This reduction is experimentally investigated using differential 3ω method. The rough nanowire exhibits 10\% reduction of thermal conductivity by forming a 100 nm thick cobalt silicide layer at both nanowire ends. To investigate the effect of silicide layer on the reduction in thermal conductivity, the theoretical analysis was performed using the nanoinclusion scattering and interfacial thermal resistance model. It found that the cobalt silicide layer reduces thermal conductivity by disturbing thermal transport in the silicon/cobalt silicide interface.",
author = "Seungho Lee and Kihyun Kim and M. Meyyappan and Baek, \{Chank Ki\}",
note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 19th IEEE International Conference on Nanotechnology, NANO 2019 ; Conference date: 22-07-2019 Through 26-07-2019",
year = "2019",
month = jul,
doi = "10.1109/NANO46743.2019.8993955",
language = "English",
series = "Proceedings of the IEEE Conference on Nanotechnology",
publisher = "IEEE Computer Society",
pages = "37--41",
booktitle = "19th IEEE International Conference on Nanotechnology, NANO 2019",
}