Skip to main navigation Skip to search Skip to main content

Thermal Conductivity of Rough Silicon Nanowires with Silicide Layer

  • Seungho Lee
  • , Kihyun Kim*
  • , M. Meyyappan
  • , Chank Ki Baek
  • *Corresponding author for this work
  • Pohang University of Science and Technology
  • NASA Ames Research Center

Research output: Contribution to conferenceConference paperpeer-review

Abstract

Rough silicon nanowires have considered as promising building block for high efficiency thermoelectric device. We demonstrate that the thermal conductivity of rough nanowires is further reduced by forming cobalt silicide layer on their both ends. This reduction is experimentally investigated using differential 3ω method. The rough nanowire exhibits 10% reduction of thermal conductivity by forming a 100 nm thick cobalt silicide layer at both nanowire ends. To investigate the effect of silicide layer on the reduction in thermal conductivity, the theoretical analysis was performed using the nanoinclusion scattering and interfacial thermal resistance model. It found that the cobalt silicide layer reduces thermal conductivity by disturbing thermal transport in the silicon/cobalt silicide interface.

Original languageEnglish
Title of host publication19th IEEE International Conference on Nanotechnology, NANO 2019
PublisherIEEE Computer Society
Pages37-41
Number of pages5
ISBN (Electronic)9781728128917
DOIs
StatePublished - 2019.07
Event19th IEEE International Conference on Nanotechnology, NANO 2019 - Macau, China
Duration: 2019.07.222019.07.26

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
Volume2019-July
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380

Conference

Conference19th IEEE International Conference on Nanotechnology, NANO 2019
Country/TerritoryChina
CityMacau
Period19.07.2219.07.26

Fingerprint

Dive into the research topics of 'Thermal Conductivity of Rough Silicon Nanowires with Silicide Layer'. Together they form a unique fingerprint.

Cite this