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Threshold voltage tuning technique in Gate-All-Around MOSFETs by utilizing gate electrode with potential distribution

  • Jun Young Park
  • , Hagyoul Bae
  • , Dong Il Moon
  • , Chang Hoon Jeon
  • , Yang Kyu Choi
  • Korea Advanced Institute of Science and Technology
  • NASA Ames Research Center
  • Samsung

Research output: Contribution to journal › Journal article › peer-review

Abstract

A technique for achieving tunable threshold voltage (VTH) is investigated in a gate-All-Around device, which is a representative floating body structure. For this concept, the in-plane gate is designed to be both a driving gate and a control gate. The control gate governs the potential distribution along the gate electrode, which acts as a built-in voltage divider in the MOSFET. During the VTH tuning by the control gate, there is no electrical performance degradation, and modulation of VTH follows a nearly perfect linear tendency. The results are verified by the electrical measurements of the fabricated device and a multi-physics simulator.

Original languageEnglish
Article number7574270
Pages (from-to)1391-1394
Number of pages4
JournalIEEE Electron Device Letters
Volume37
Issue number11
DOIs
StatePublished - 2016.11

Keywords

  • Gate-All-Around (GAA)
  • MOSFET
  • Nanowire transistor
  • Tunable threshold voltage

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