Time-resolved ultraviolet near-field scanning optical microscope for characterizing photoluminescence lifetime of light-emitting devices

Kyoung Duck Park; Hyun Jeong; Yong Hwan Kim; Sang Youp Yim; Hong Seok Lee; Eun Kyung Suh; Mun Seok Jeong

doi:10.1166/jnn.2013.6992

Time-resolved ultraviolet near-field scanning optical microscope for characterizing photoluminescence lifetime of light-emitting devices

Kyoung Duck Park
, Hyun Jeong
, Yong Hwan Kim
, Sang Youp Yim
, Hong Seok Lee
, Eun Kyung Suh
, Mun Seok Jeong^*

^*Corresponding author for this work

Department of Physics

Gwangju Institute of Science and Technology
Jeonbuk National University
Sungkyunkwan University
Jeju National University

Research output: Contribution to journal › Journal article › peer-review

3 Scopus citations

Abstract

We developed a instrument consisting of an ultraviolet (UV) near-field scanning optical microscope (NSOM) combined with time-correlated single photon counting, which allows efficient observation of temporal dynamics of near-field photoluminescence (PL) down to the sub-wavelength scale. The developed time-resolved UV NSOM system showed a spatial resolution of 110 nm and a temporal resolution of 130 ps in the optical signal. The proposed microscope system was successfully demonstrated by characterizing the near-field PL lifetime of InGaN/GaN multiple quantum wells.

Original language	English
Pages (from-to)	1798-1801
Number of pages	4
Journal	Journal of nanoscience and nanotechnology
Volume	13
Issue number	3
DOIs	https://doi.org/10.1166/jnn.2013.6992
State	Published - 2013.03

Keywords

Near-field scanning optical microscopy (NSOM)
Time-correlated single photon counting (TCSPC)
Time-resolved photoluminescence (TRPL)

Quacquarelli Symonds(QS) Subject Topics

Materials Science
Engineering - Chemical
Chemistry
Physics & Astronomy
Biological Sciences

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10.1166/jnn.2013.6992

Cite this

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title = "Time-resolved ultraviolet near-field scanning optical microscope for characterizing photoluminescence lifetime of light-emitting devices",

abstract = "We developed a instrument consisting of an ultraviolet (UV) near-field scanning optical microscope (NSOM) combined with time-correlated single photon counting, which allows efficient observation of temporal dynamics of near-field photoluminescence (PL) down to the sub-wavelength scale. The developed time-resolved UV NSOM system showed a spatial resolution of 110 nm and a temporal resolution of 130 ps in the optical signal. The proposed microscope system was successfully demonstrated by characterizing the near-field PL lifetime of InGaN/GaN multiple quantum wells.",

keywords = "Near-field scanning optical microscopy (NSOM), Time-correlated single photon counting (TCSPC), Time-resolved photoluminescence (TRPL)",

author = "Park, \{Kyoung Duck\} and Hyun Jeong and Kim, \{Yong Hwan\} and Yim, \{Sang Youp\} and Lee, \{Hong Seok\} and Suh, \{Eun Kyung\} and Jeong, \{Mun Seok\}",

year = "2013",

month = mar,

doi = "10.1166/jnn.2013.6992",

language = "English",

volume = "13",

pages = "1798--1801",

journal = "Journal of nanoscience and nanotechnology",

issn = "1533-4880",

number = "3",

}

TY - JOUR

T1 - Time-resolved ultraviolet near-field scanning optical microscope for characterizing photoluminescence lifetime of light-emitting devices

AU - Park, Kyoung Duck

AU - Jeong, Hyun

AU - Kim, Yong Hwan

AU - Yim, Sang Youp

AU - Lee, Hong Seok

AU - Suh, Eun Kyung

AU - Jeong, Mun Seok

PY - 2013/3

Y1 - 2013/3

N2 - We developed a instrument consisting of an ultraviolet (UV) near-field scanning optical microscope (NSOM) combined with time-correlated single photon counting, which allows efficient observation of temporal dynamics of near-field photoluminescence (PL) down to the sub-wavelength scale. The developed time-resolved UV NSOM system showed a spatial resolution of 110 nm and a temporal resolution of 130 ps in the optical signal. The proposed microscope system was successfully demonstrated by characterizing the near-field PL lifetime of InGaN/GaN multiple quantum wells.

AB - We developed a instrument consisting of an ultraviolet (UV) near-field scanning optical microscope (NSOM) combined with time-correlated single photon counting, which allows efficient observation of temporal dynamics of near-field photoluminescence (PL) down to the sub-wavelength scale. The developed time-resolved UV NSOM system showed a spatial resolution of 110 nm and a temporal resolution of 130 ps in the optical signal. The proposed microscope system was successfully demonstrated by characterizing the near-field PL lifetime of InGaN/GaN multiple quantum wells.

KW - Near-field scanning optical microscopy (NSOM)

KW - Time-correlated single photon counting (TCSPC)

KW - Time-resolved photoluminescence (TRPL)

UR - https://www.scopus.com/pages/publications/84876238920

U2 - 10.1166/jnn.2013.6992

DO - 10.1166/jnn.2013.6992

M3 - Journal article

AN - SCOPUS:84876238920

SN - 1533-4880

VL - 13

SP - 1798

EP - 1801

JO - Journal of nanoscience and nanotechnology

JF - Journal of nanoscience and nanotechnology

IS - 3

ER -

Time-resolved ultraviolet near-field scanning optical microscope for characterizing photoluminescence lifetime of light-emitting devices

Abstract

Keywords

Quacquarelli Symonds(QS) Subject Topics

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