TY - GEN
T1 - Towards a formal framework for product line test development
AU - Kang, Sungwon
AU - Lee, Jihyun
AU - Kim, Myungchul
AU - Lee, Woojin
PY - 2007
Y1 - 2007
N2 - Product line test development is more complicated than the conventional test development for a single application. There were numerous research works in the past that address various issues and aspects that arise in product line testing and test development. However, we still lack a coherent framework that can guide product line test development and link various product line development concepts to relevant product line testing concepts. In this paper we provide a basis for a formal framework for product line test development by linking product line development concepts such as feature, variability, product line architecture, component and use case scenario to product line test concepts such as test architecture, variability for test and test scenario and by providing a systematic way for deriving product line tests, adapting product line tests to a specific product and deriving product specific tests.
AB - Product line test development is more complicated than the conventional test development for a single application. There were numerous research works in the past that address various issues and aspects that arise in product line testing and test development. However, we still lack a coherent framework that can guide product line test development and link various product line development concepts to relevant product line testing concepts. In this paper we provide a basis for a formal framework for product line test development by linking product line development concepts such as feature, variability, product line architecture, component and use case scenario to product line test concepts such as test architecture, variability for test and test scenario and by providing a systematic way for deriving product line tests, adapting product line tests to a specific product and deriving product specific tests.
UR - https://www.scopus.com/pages/publications/38049046067
U2 - 10.1109/CIT.2007.4385203
DO - 10.1109/CIT.2007.4385203
M3 - Conference paper
AN - SCOPUS:38049046067
SN - 0769529836
SN - 9780769529837
T3 - CIT 2007: 7th IEEE International Conference on Computer and Information Technology
SP - 921
EP - 926
BT - CIT 2007
T2 - CIT 2007: 7th IEEE International Conference on Computer and Information Technology
Y2 - 16 October 2007 through 19 October 2007
ER -