Transmission Electron Microscopy Obser-vation of a Single Ni Dot Fabricated Using Scanning Tunneling Microscopy

Research output: Contribution to journal › Journal article › peer-review

Original language	Korean
Journal	International Journal of Precision Engineering and Manufacturing
State	Published - 2010.06.1

Cite this

@article{79ef5ed9763d4d41a39e93c1ecb83ab2,

title = "Transmission Electron Microscopy Obser-vation of a Single Ni Dot Fabricated Using Scanning Tunneling Microscopy",

author = "Hyung-Sub Kang and Chul-Un Hong",

year = "2010",

month = jun,

day = "1",

language = "Korean",

journal = "International Journal of Precision Engineering and Manufacturing",

issn = "1229-8557",

}

TY - JOUR

T1 - Transmission Electron Microscopy Obser-vation of a Single Ni Dot Fabricated Using Scanning Tunneling Microscopy

AU - Kang, Hyung-Sub

AU - Hong, Chul-Un

PY - 2010/6/1

Y1 - 2010/6/1

M3 - Journal article

SN - 1229-8557

JO - International Journal of Precision Engineering and Manufacturing

JF - International Journal of Precision Engineering and Manufacturing

ER -