Two-phase edge outlier detection method for technology opportunity discovery

Byunghoon Kim; Gianluca Gazzola; Jaekyung Yang; Jae Min Lee; Byoung Youl Coh; Myong K. Jeong; Young Seon Jeong

doi:10.1007/s11192-017-2472-1

Two-phase edge outlier detection method for technology opportunity discovery

Byunghoon Kim
, Gianluca Gazzola
, Jaekyung Yang
, Jae Min Lee
, Byoung Youl Coh
, Myong K. Jeong
, Young Seon Jeong^*

^*Corresponding author for this work

Department of Industrial and Information Systems Engineering

Korea Institute of Science and Technology Information
Rutgers Center for Operations Research
Rutgers - The State University of New Jersey, New Brunswick
Chonnam National University

Research output: Contribution to journal › Journal article › peer-review

25 Scopus citations

Abstract

This article introduces a method for identifying potential opportunities of innovation arising from the convergence of different technological areas, based on the presence of edge outliers in a patent citation network. Edge outliers are detected via the assessment of their centrality; pairs of patents connected by edge outliers are then analyzed for technological relatedness and past involvement in technological convergence. The pairs with the highest potential for future convergence are finally selected and their keywords combined to suggest new directions of innovation. We illustrate our method on a data set of US patents in the field of digital information and security.

Original language	English
Pages (from-to)	1-16
Number of pages	16
Journal	Scientometrics
Volume	113
Issue number	1
DOIs	https://doi.org/10.1007/s11192-017-2472-1
State	Published - 2017.10.1

Keywords

Edge outlier
Outlier detection
Patent citation network
Technology convergence
Technology opportunity discovery

Quacquarelli Symonds(QS) Subject Topics

Computer Science & Information Systems
Data Science
Library & Information Management

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10.1007/s11192-017-2472-1

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title = "Two-phase edge outlier detection method for technology opportunity discovery",

abstract = "This article introduces a method for identifying potential opportunities of innovation arising from the convergence of different technological areas, based on the presence of edge outliers in a patent citation network. Edge outliers are detected via the assessment of their centrality; pairs of patents connected by edge outliers are then analyzed for technological relatedness and past involvement in technological convergence. The pairs with the highest potential for future convergence are finally selected and their keywords combined to suggest new directions of innovation. We illustrate our method on a data set of US patents in the field of digital information and security.",

keywords = "Edge outlier, Outlier detection, Patent citation network, Technology convergence, Technology opportunity discovery",

author = "Byunghoon Kim and Gianluca Gazzola and Jaekyung Yang and Lee, \{Jae Min\} and Coh, \{Byoung Youl\} and Jeong, \{Myong K.\} and Jeong, \{Young Seon\}",

note = "Publisher Copyright: {\textcopyright} 2017, Akad{\'e}miai Kiad{\'o}, Budapest, Hungary.",

year = "2017",

month = oct,

day = "1",

doi = "10.1007/s11192-017-2472-1",

language = "English",

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journal = "Scientometrics",

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T1 - Two-phase edge outlier detection method for technology opportunity discovery

AU - Kim, Byunghoon

AU - Gazzola, Gianluca

AU - Yang, Jaekyung

AU - Lee, Jae Min

AU - Coh, Byoung Youl

AU - Jeong, Myong K.

AU - Jeong, Young Seon

PY - 2017/10/1

Y1 - 2017/10/1

N2 - This article introduces a method for identifying potential opportunities of innovation arising from the convergence of different technological areas, based on the presence of edge outliers in a patent citation network. Edge outliers are detected via the assessment of their centrality; pairs of patents connected by edge outliers are then analyzed for technological relatedness and past involvement in technological convergence. The pairs with the highest potential for future convergence are finally selected and their keywords combined to suggest new directions of innovation. We illustrate our method on a data set of US patents in the field of digital information and security.

AB - This article introduces a method for identifying potential opportunities of innovation arising from the convergence of different technological areas, based on the presence of edge outliers in a patent citation network. Edge outliers are detected via the assessment of their centrality; pairs of patents connected by edge outliers are then analyzed for technological relatedness and past involvement in technological convergence. The pairs with the highest potential for future convergence are finally selected and their keywords combined to suggest new directions of innovation. We illustrate our method on a data set of US patents in the field of digital information and security.

KW - Edge outlier

KW - Outlier detection

KW - Patent citation network

KW - Technology convergence

KW - Technology opportunity discovery

UR - https://www.scopus.com/pages/publications/85026806988

U2 - 10.1007/s11192-017-2472-1

DO - 10.1007/s11192-017-2472-1

M3 - Journal article

AN - SCOPUS:85026806988

SN - 0138-9130

VL - 113

SP - 1

EP - 16

JO - Scientometrics

JF - Scientometrics

IS - 1

ER -

Two-phase edge outlier detection method for technology opportunity discovery

Abstract

Keywords

Quacquarelli Symonds(QS) Subject Topics

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