Abstract
A two-step growth method for growing high quality long n-GaN:Si nanowires (NWs) on Si(111) substrates using metalorganic chemical vapor deposition (MOCVD) was developed. In the primary step μ-GaN seeds were grown at 710 C by pulsed growth method using MOCVD and in the secondary stage, we suitably increased the growth temperature to 950 C in order to grow the high quality long n-GaN:Si NWs by continuous flow mode. We grew n-GaN:Si NWs at various pairs of μ-GaN seed so as to examine its effect on the growth rate. The density and length of n-GaN:Si NWs were improved with the increase of seeds up to 10 pairs. The number of seed pairs determines the density and length of n-GaN:Si NWs, but they did not affect its diameter directly. Field emission scanning electron microscopy, X-ray diffraction, photoluminescence, cathodoluminescence and high-resolution transmission electron microscopy were used to characterize the specimens.
| Original language | English |
|---|---|
| Pages (from-to) | 58-63 |
| Number of pages | 6 |
| Journal | Thin Solid Films |
| Volume | 548 |
| DOIs | |
| State | Published - 2013.12.2 |
Keywords
- III-nitrides semiconductors
- Metalorganic chemical deposition
- n-GaN:Si
- Nanowires
- Seeding
Quacquarelli Symonds(QS) Subject Topics
- Materials Science
- Physics & Astronomy
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