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Ultraviolet tip-enhanced nanoscale Raman imaging

  • Kyoung Duck Park
  • , Yong Hwan Kim
  • , Jin Ho Park
  • , Jung Su Park
  • , Hong Seok Lee
  • , Sang Youp Yim
  • , Young Hee Lee*
  • , Mun Seok Jeong
  • *Corresponding author for this work
  • Gwangju Institute of Science and Technology
  • Sungkyunkwan University
  • Jeju National University

Research output: Contribution to journalJournal articlepeer-review

Abstract

We have constructed an ultraviolet (UV)-apertureless near-field scanning optical microscope-Raman spectroscopy system by using an aluminum tip for the simultaneous measurement of topography and Raman scattering of nanomaterials with high spatial resolution. The topography, Rayleigh scattering image, and tip-enhanced Raman scattering image of the carbon nanotube film showed that a spatial resolution of around 19 nm was achieved. This spatial resolution of UV-Raman mapping image exceeds that of previous approaches, which have several hundred nanometers of spatial resolution.

Original languageEnglish
Pages (from-to)1931-1934
Number of pages4
JournalJournal of Raman Spectroscopy
Volume43
Issue number12
DOIs
StatePublished - 2012.12

Keywords

  • aluminum
  • carbon nanotube film
  • near-field scanning optical microscope (NSOM)
  • tip-enhanced Raman scattering (TERS)
  • ultraviolet (UV)

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