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Wafer-Scale Growth of a MoS2Monolayer via One Cycle of Atomic Layer Deposition: An Adsorbate Control Method

  • Dae Hyun Kim
  • , Jae Chan Park
  • , Jeongwoo Park
  • , Deok Yong Cho
  • , Woo Hee Kim
  • , Bonggeun Shong*
  • , Ji Hoon Ahn*
  • , Tae Joo Park*
  • *Corresponding author for this work
  • Hanyang University
  • Hongik University

Research output: Contribution to journalJournal articlepeer-review

Abstract

Monolayer transition metal dichalcogenide compounds with two-dimensional (2D) layered structures may be used as next-generation active materials for electronic and optoelectronic devices. A reliable method for creating high-quality, wafer-scale material with well-controlled large-area growth is required for industrial applications. Two-dimensional material atomic layer deposition (ALD) can be used as an atomically flat monolayer film, but its deposition characteristics limit perfect monolayer formation. Herein, we propose a novel ALD chemical route for uniform monolayer MoS2 film deposition at the wafer scale. We first modulate the precursor injection step to precisely control one cycle's adsorbed precursor amount in a range exceeding a "typical"ALD reaction. Utilizing this process, we successfully created a complete monolayer MoS2 film in one ALD cycle. The film exhibited excellent uniformity at the wafer scale, and its luminescence quantum efficiency was approximately 9 times greater than that of film formed via conventional ALD. These results indicate this method can be employed to obtain complete single layers or to develop high-quality monolayer-scale 2D materials.

Original languageEnglish
Pages (from-to)4099-4105
Number of pages7
JournalChemistry of Materials
Volume33
Issue number11
DOIs
StatePublished - 2021.06.8

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Engineering - Chemical
  • Chemistry

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