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Wafer-scale single-crystal hexagonal boron nitride film via self-collimated grain formation

  • Joo Song Lee
  • , Soo Ho Choi
  • , Seok Joon Yun
  • , Yong In Kim
  • , Stephen Boandoh
  • , Ji Hoon Park
  • , Bong Gyu Shin
  • , Hayoung Ko
  • , Seung Hee Lee
  • , Young Min Kim
  • , Young Hee Lee*
  • , Ki Kang Kim
  • , Soo Min Kim
  • *Corresponding author for this work
  • Korea Institute of Science and Technology
  • Jeonbuk National University
  • Dongguk University
  • Institute for Basic Science
  • Sungkyunkwan University
  • Ewha Womans University

Research output: Contribution to journalJournal articlepeer-review

Abstract

Although polycrystalline hexagonal boron nitride (PC-hBN) has been realized, defects and grain boundaries still cause charge scatterings and trap sites, impeding high-performance electronics. Here, we report a method of synthesizing wafer-scale single-crystalline hBN (SC-hBN) monolayer films by chemical vapor deposition. The limited solubility of boron (B) and nitrogen (N) atoms in liquid gold promotes high diffusion of adatoms on the surface of liquid at high temperature to provoke the circular hBN grains. These further evolve into closely packed unimodal grains by means of self-collimation of B and N edges inherited by electrostatic interaction between grains, eventually forming an SC-hBN film on a wafer scale. This SC-hBN film also allows for the synthesis of wafer-scale graphene/hBN heterostructure and single-crystalline tungsten disulfide.

Original languageEnglish
Pages (from-to)817-821
Number of pages5
JournalScience
Volume362
Issue number6416
DOIs
StatePublished - 2018.11.16

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