Skip to main navigation Skip to search Skip to main content

X-ray absorption studies of the local structure and f-level occupancy in CeIr 1-xRh xIn 5

  • M. Daniel*
  • , S. W. Han
  • , C. H. Booth
  • , A. L. Cornelius
  • , P. G. Pagliuso
  • , J. L. Sarrao
  • , J. D. Thompson
  • *Corresponding author for this work
  • Lawrence Berkeley National Laboratory
  • University of Nevada, Las Vegas
  • Los Alamos National Laboratory

Research output: Contribution to journalJournal articlepeer-review

Abstract

The CeIr 1-xRh xIn 5 series exhibits a range of interesting phenomena, including heavy-fermion superconductivity, non-Fermi liquid behavior, and concomitant antiferromagnetism and superconductivity. In the low-Rh concentration range (0.1≤x≤0.5), specific heat measurements show a broad anomaly, suggestive of gross phase separation. We have performed x-ray absorption experiments at the Ce L III,Ir L III, and Rh K-edges as a function of Rh concentration and temperature. X-ray absorption near-edge structure measurements indicate that cerium is close to trivalent in this system, with no measurable change with temperature from 20-300 K, consistent with a heavy-fermion material. Extended x-ray absorption fine structure measurements as a function of temperature from all measured edges indicate the local crystal structure of all samples is well ordered, with no gross phase separation observed, even for samples with x=0.125 and x=0.25. These results therefore suggest that the anomalous specific heat behavior in the 0.1≤x≤0.5 range have some other explanation, and some possibilities are discussed.

Original languageEnglish
Article number054417
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume71
Issue number5
DOIs
StatePublished - 2005.02

Quacquarelli Symonds(QS) Subject Topics

  • Materials Science
  • Physics & Astronomy

Fingerprint

Dive into the research topics of 'X-ray absorption studies of the local structure and f-level occupancy in CeIr 1-xRh xIn 5'. Together they form a unique fingerprint.

Cite this