X-ray reflectivity study of thin film oxide superconductors

S. W. Han; J. A. Pitney; P. F. Miceli; M. Covington; L. H. Greene; M. J. Godbole; D. H. Lowndes

doi:10.1016/0921-4526(95)00931-0

X-ray reflectivity study of thin film oxide superconductors

S. W. Han^*
, J. A. Pitney
, P. F. Miceli
, M. Covington
, L. H. Greene
, M. J. Godbole
, D. H. Lowndes

^*Corresponding author for this work

Physics Education

University of Missouri
University of Illinois at Urbana-Champaign

Research output: Contribution to journal › Journal article › peer-review

8 Scopus citations

Abstract

Results are presented from X-ray reflectivity measurements that examine the interface roughness of YBa₂Cu₃O_7-x films. We focus on the quality of these interfaces for studies of the London penetration depth using neutron reflection and for tunnel junctions containing Pb cap layers.

Original language	English
Pages (from-to)	235-237
Number of pages	3
Journal	Physica B: Physics of Condensed Matter
Volume	221
Issue number	1-4
DOIs	https://doi.org/10.1016/0921-4526(95)00931-0
State	Published - 1996.04.2

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@article{b4befb0540a9486b9f34a75f6a66f715,

title = "X-ray reflectivity study of thin film oxide superconductors",

abstract = "Results are presented from X-ray reflectivity measurements that examine the interface roughness of YBa2Cu3O7-x films. We focus on the quality of these interfaces for studies of the London penetration depth using neutron reflection and for tunnel junctions containing Pb cap layers.",

author = "Han, \{S. W.\} and Pitney, \{J. A.\} and Miceli, \{P. F.\} and M. Covington and Greene, \{L. H.\} and Godbole, \{M. J.\} and Lowndes, \{D. H.\}",

year = "1996",

month = apr,

day = "2",

doi = "10.1016/0921-4526(95)00931-0",

language = "English",

volume = "221",

pages = "235--237",

journal = "Physica B: Physics of Condensed Matter",

issn = "0921-4526",

number = "1-4",

}

TY - JOUR

T1 - X-ray reflectivity study of thin film oxide superconductors

AU - Han, S. W.

AU - Pitney, J. A.

AU - Miceli, P. F.

AU - Covington, M.

AU - Greene, L. H.

AU - Godbole, M. J.

AU - Lowndes, D. H.

PY - 1996/4/2

Y1 - 1996/4/2

N2 - Results are presented from X-ray reflectivity measurements that examine the interface roughness of YBa2Cu3O7-x films. We focus on the quality of these interfaces for studies of the London penetration depth using neutron reflection and for tunnel junctions containing Pb cap layers.

AB - Results are presented from X-ray reflectivity measurements that examine the interface roughness of YBa2Cu3O7-x films. We focus on the quality of these interfaces for studies of the London penetration depth using neutron reflection and for tunnel junctions containing Pb cap layers.

UR - https://www.scopus.com/pages/publications/0030563015

U2 - 10.1016/0921-4526(95)00931-0

DO - 10.1016/0921-4526(95)00931-0

M3 - Journal article

AN - SCOPUS:0030563015

SN - 0921-4526

VL - 221

SP - 235

EP - 237

JO - Physica B: Physics of Condensed Matter

JF - Physica B: Physics of Condensed Matter

IS - 1-4

ER -

X-ray reflectivity study of thin film oxide superconductors

Abstract

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